Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography

Jianwei Miao, Chien Chun Chen, M. C. Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R. White, Chin Yi Chiu, B. C. Regan, Yu Huang, Laurence D. Marks, Ulrich Dahmen

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