Three-dimensional nanoscale composition mapping of semiconductor nanowires

Daniel E. Perea; Jonathan E. Allen; Steven J. May; Bruce W. Wessels; David N. Seidman; Lincoln J. Lauhon

doi:10.1021/nl051602p

Three-dimensional nanoscale composition mapping of semiconductor nanowires

Daniel E. Perea, Jonathan E. Allen, Steven J. May, Bruce W. Wessels, David N. Seidman, Lincoln J. Lauhon^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

217 Scopus citations

Abstract

We demonstrate the three-dimensional composition mapping of a semiconductor nanowire with single-atom sensitivity and subnanometer spatial resolution using atom probe tomography. A new class of atom probe, the local electrode atom probe (LEAP) microscope, was used to map the position of single Au atoms in an InAs nanowire and to image the interface between a Au catalyst and InAs in three dimensions with 0.3-nm resolution. These results establish atom probe tomography as a uniquely powerful tool for analyzing the chemical composition of semiconductor nanostructures.

Original language	English (US)
Pages (from-to)	181-185
Number of pages	5
Journal	Nano letters
Volume	6
Issue number	2
DOIs	https://doi.org/10.1021/nl051602p
State	Published - Feb 2006

ASJC Scopus subject areas

Bioengineering
General Chemistry
General Materials Science
Condensed Matter Physics
Mechanical Engineering

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@article{b310269ea4fd41df904914bf01317c92,

title = "Three-dimensional nanoscale composition mapping of semiconductor nanowires",

abstract = "We demonstrate the three-dimensional composition mapping of a semiconductor nanowire with single-atom sensitivity and subnanometer spatial resolution using atom probe tomography. A new class of atom probe, the local electrode atom probe (LEAP) microscope, was used to map the position of single Au atoms in an InAs nanowire and to image the interface between a Au catalyst and InAs in three dimensions with 0.3-nm resolution. These results establish atom probe tomography as a uniquely powerful tool for analyzing the chemical composition of semiconductor nanostructures.",

author = "Perea, {Daniel E.} and Allen, {Jonathan E.} and May, {Steven J.} and Wessels, {Bruce W.} and Seidman, {David N.} and Lauhon, {Lincoln J.}",

year = "2006",

month = feb,

doi = "10.1021/nl051602p",

language = "English (US)",

volume = "6",

pages = "181--185",

journal = "Nano letters",

issn = "1530-6984",

publisher = "American Chemical Society",

number = "2",

}

TY - JOUR

T1 - Three-dimensional nanoscale composition mapping of semiconductor nanowires

AU - Perea, Daniel E.

AU - Allen, Jonathan E.

AU - May, Steven J.

AU - Wessels, Bruce W.

AU - Seidman, David N.

AU - Lauhon, Lincoln J.

PY - 2006/2

Y1 - 2006/2

N2 - We demonstrate the three-dimensional composition mapping of a semiconductor nanowire with single-atom sensitivity and subnanometer spatial resolution using atom probe tomography. A new class of atom probe, the local electrode atom probe (LEAP) microscope, was used to map the position of single Au atoms in an InAs nanowire and to image the interface between a Au catalyst and InAs in three dimensions with 0.3-nm resolution. These results establish atom probe tomography as a uniquely powerful tool for analyzing the chemical composition of semiconductor nanostructures.

AB - We demonstrate the three-dimensional composition mapping of a semiconductor nanowire with single-atom sensitivity and subnanometer spatial resolution using atom probe tomography. A new class of atom probe, the local electrode atom probe (LEAP) microscope, was used to map the position of single Au atoms in an InAs nanowire and to image the interface between a Au catalyst and InAs in three dimensions with 0.3-nm resolution. These results establish atom probe tomography as a uniquely powerful tool for analyzing the chemical composition of semiconductor nanostructures.

UR - http://www.scopus.com/inward/record.url?scp=33644878950&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33644878950&partnerID=8YFLogxK

U2 - 10.1021/nl051602p

DO - 10.1021/nl051602p

M3 - Article

C2 - 16464031

AN - SCOPUS:33644878950

SN - 1530-6984

VL - 6

SP - 181

EP - 185

JO - Nano letters

JF - Nano letters

IS - 2

ER -

Three-dimensional nanoscale composition mapping of semiconductor nanowires

Abstract

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