Time aberrations of uniform fields

An improved reflectron mass spectrometer for an atom-probe field-ion microscope

M. R. Scheinfein*, David N Seidman

*Corresponding author for this work

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The mass resolution of the atom-probe field-ion microscope is limited by the time resolution of the ion-separating spectrometer. Time aberrations of uniform fields are investigated in general in order to characterize the optimal performance of high-transmission, high-mass resolution, multistage reflectron lenses. Correction of higher order time aberrations greatly improves the mass resolution. For an ion beam with an energy distributed uniformly about some nominal energy, E0±dE, mass resolutions (base width) of m/dm=848, 1344, 2151, 3571 can be achieved for single-, double-, triple- and quadruple-stage reflectron mass spectrometers when dE=0.1E0. A unique design example employing both second- and third-order time correction is given for an atom-probe field-ion microscope.

Original languageEnglish (US)
Pages (from-to)3126-3131
Number of pages6
JournalReview of Scientific Instruments
Volume64
Issue number11
DOIs
StatePublished - Dec 1 1993

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Ion microscopes
ion microscopes
Mass spectrometers
Aberrations
mass spectrometers
aberration
Atoms
probes
Ion beams
atoms
Spectrometers
Lenses
Ions
ion beams
lenses
energy

ASJC Scopus subject areas

  • Instrumentation

Cite this

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abstract = "The mass resolution of the atom-probe field-ion microscope is limited by the time resolution of the ion-separating spectrometer. Time aberrations of uniform fields are investigated in general in order to characterize the optimal performance of high-transmission, high-mass resolution, multistage reflectron lenses. Correction of higher order time aberrations greatly improves the mass resolution. For an ion beam with an energy distributed uniformly about some nominal energy, E0±dE, mass resolutions (base width) of m/dm=848, 1344, 2151, 3571 can be achieved for single-, double-, triple- and quadruple-stage reflectron mass spectrometers when dE=0.1E0. A unique design example employing both second- and third-order time correction is given for an atom-probe field-ion microscope.",
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Time aberrations of uniform fields : An improved reflectron mass spectrometer for an atom-probe field-ion microscope. / Scheinfein, M. R.; Seidman, David N.

In: Review of Scientific Instruments, Vol. 64, No. 11, 01.12.1993, p. 3126-3131.

Research output: Contribution to journalArticle

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AU - Seidman, David N

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