TY - JOUR
T1 - Time aberrations of uniform fields
T2 - An improved reflectron mass spectrometer for an atom-probe field-ion microscope
AU - Scheinfein, M. R.
AU - Seidman, D. N.
PY - 1993
Y1 - 1993
N2 - The mass resolution of the atom-probe field-ion microscope is limited by the time resolution of the ion-separating spectrometer. Time aberrations of uniform fields are investigated in general in order to characterize the optimal performance of high-transmission, high-mass resolution, multistage reflectron lenses. Correction of higher order time aberrations greatly improves the mass resolution. For an ion beam with an energy distributed uniformly about some nominal energy, E0±dE, mass resolutions (base width) of m/dm=848, 1344, 2151, 3571 can be achieved for single-, double-, triple- and quadruple-stage reflectron mass spectrometers when dE=0.1E0. A unique design example employing both second- and third-order time correction is given for an atom-probe field-ion microscope.
AB - The mass resolution of the atom-probe field-ion microscope is limited by the time resolution of the ion-separating spectrometer. Time aberrations of uniform fields are investigated in general in order to characterize the optimal performance of high-transmission, high-mass resolution, multistage reflectron lenses. Correction of higher order time aberrations greatly improves the mass resolution. For an ion beam with an energy distributed uniformly about some nominal energy, E0±dE, mass resolutions (base width) of m/dm=848, 1344, 2151, 3571 can be achieved for single-, double-, triple- and quadruple-stage reflectron mass spectrometers when dE=0.1E0. A unique design example employing both second- and third-order time correction is given for an atom-probe field-ion microscope.
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U2 - 10.1063/1.1144319
DO - 10.1063/1.1144319
M3 - Article
AN - SCOPUS:34047158630
SN - 0034-6748
VL - 64
SP - 3126
EP - 3131
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 11
ER -