Time-of-flight pulsed ion beam surface analysis as a means of in situ, real-time characterization of the growth of ferroelectric and conductive oxide heterostructures

A. R. Krauss, O. Auciello, Y. Lin, R. P.H. Chang, D. M. Gruen

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'Time-of-flight pulsed ion beam surface analysis as a means of in situ, real-time characterization of the growth of ferroelectric and conductive oxide heterostructures'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy