Toward nanometer-scale resolution in fluorescence microscopy using spectral self-interference

Anna K. Swan; Lev A. Moiseev; C. R. Cantor; Brynmor Davis; S. B. Ippolito; William Clem Karl; Bennett B. Goldberg; M. Selim Ünlü

doi:10.1109/JSTQE.2003.814191

Toward nanometer-scale resolution in fluorescence microscopy using spectral self-interference

Anna K. Swan^*, Lev A. Moiseev, C. R. Cantor, Brynmor Davis, S. B. Ippolito, William Clem Karl, Bennett B. Goldberg, M. Selim Ünlü

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

43 Scopus citations

Abstract

We introduce a new fluorescence microscopy technique that maps the axial position of a fluorophore with subnanometer precision. The interference of the emission of fluorophores in proximity to a reflecting surface results in fringes in the fluorescence spectrum that provide a unique signature of the axial position of the fluorophore. The nanometer sensitivity is demonstrated by measuring the height of a fluorescein monolayer covering a 12-nm step etched in silicon dioxide. In addition, the separation between fluorophores attached to the top or the bottom layer in a lipid bilayer film is determined. We further discuss extension of this microscopy technique to provide resolution of multiple layers spaced as closely as 10 nm for sparse systems.

Original language	English (US)
Pages (from-to)	294-300
Number of pages	7
Journal	IEEE Journal on Selected Topics in Quantum Electronics
Volume	9
Issue number	2
DOIs	https://doi.org/10.1109/JSTQE.2003.814191
State	Published - Mar 2003

Keywords

Fluorescence microscopy
Interference
Spectroscopy
Ultra high-optical resolution

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1109/JSTQE.2003.814191

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@article{10332eb7b740459d832456365e828576,

title = "Toward nanometer-scale resolution in fluorescence microscopy using spectral self-interference",

abstract = "We introduce a new fluorescence microscopy technique that maps the axial position of a fluorophore with subnanometer precision. The interference of the emission of fluorophores in proximity to a reflecting surface results in fringes in the fluorescence spectrum that provide a unique signature of the axial position of the fluorophore. The nanometer sensitivity is demonstrated by measuring the height of a fluorescein monolayer covering a 12-nm step etched in silicon dioxide. In addition, the separation between fluorophores attached to the top or the bottom layer in a lipid bilayer film is determined. We further discuss extension of this microscopy technique to provide resolution of multiple layers spaced as closely as 10 nm for sparse systems.",

keywords = "Fluorescence microscopy, Interference, Spectroscopy, Ultra high-optical resolution",

author = "Swan, {Anna K.} and Moiseev, {Lev A.} and Cantor, {C. R.} and Brynmor Davis and Ippolito, {S. B.} and Karl, {William Clem} and Goldberg, {Bennett B.} and {\"U}nl{\"u}, {M. Selim}",

note = "Funding Information: Manuscript received December 11, 2002; revised February 10, 2003. This work was supported in part by the National Science Foundation under Grant DBI-0128425 and in part by Corning, Inc.",

year = "2003",

month = mar,

doi = "10.1109/JSTQE.2003.814191",

language = "English (US)",

volume = "9",

pages = "294--300",

journal = "IEEE Journal on Selected Topics in Quantum Electronics",

issn = "1077-260X",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2",

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T1 - Toward nanometer-scale resolution in fluorescence microscopy using spectral self-interference

AU - Swan, Anna K.

AU - Moiseev, Lev A.

AU - Cantor, C. R.

AU - Davis, Brynmor

AU - Ippolito, S. B.

AU - Karl, William Clem

AU - Goldberg, Bennett B.

AU - Ünlü, M. Selim

N1 - Funding Information: Manuscript received December 11, 2002; revised February 10, 2003. This work was supported in part by the National Science Foundation under Grant DBI-0128425 and in part by Corning, Inc.

PY - 2003/3

Y1 - 2003/3

N2 - We introduce a new fluorescence microscopy technique that maps the axial position of a fluorophore with subnanometer precision. The interference of the emission of fluorophores in proximity to a reflecting surface results in fringes in the fluorescence spectrum that provide a unique signature of the axial position of the fluorophore. The nanometer sensitivity is demonstrated by measuring the height of a fluorescein monolayer covering a 12-nm step etched in silicon dioxide. In addition, the separation between fluorophores attached to the top or the bottom layer in a lipid bilayer film is determined. We further discuss extension of this microscopy technique to provide resolution of multiple layers spaced as closely as 10 nm for sparse systems.

AB - We introduce a new fluorescence microscopy technique that maps the axial position of a fluorophore with subnanometer precision. The interference of the emission of fluorophores in proximity to a reflecting surface results in fringes in the fluorescence spectrum that provide a unique signature of the axial position of the fluorophore. The nanometer sensitivity is demonstrated by measuring the height of a fluorescein monolayer covering a 12-nm step etched in silicon dioxide. In addition, the separation between fluorophores attached to the top or the bottom layer in a lipid bilayer film is determined. We further discuss extension of this microscopy technique to provide resolution of multiple layers spaced as closely as 10 nm for sparse systems.

KW - Fluorescence microscopy

KW - Interference

KW - Spectroscopy

KW - Ultra high-optical resolution

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DO - 10.1109/JSTQE.2003.814191

M3 - Article

AN - SCOPUS:0242661576

SN - 1077-260X

VL - 9

SP - 294

EP - 300

JO - IEEE Journal on Selected Topics in Quantum Electronics

JF - IEEE Journal on Selected Topics in Quantum Electronics

IS - 2

ER -

Toward nanometer-scale resolution in fluorescence microscopy using spectral self-interference

Abstract

Keywords

ASJC Scopus subject areas

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