Towards an integrated materials characterization toolbox

Ian M. Robertson^*, Christopher A. Schuh, John S. Vetrano, Nigel D. Browning, David P. Field, Dorte Juul Jensen, Michael K. Miller, Ian Baker, David C. Dunand, Rafal Dunin-Borkowski, Bernd Kabius, Tom Kelly, Sergio Lozano-Perez, Amit Misra, Gregory S. Rohrer, Anthony D. Rollett, Mitra L. Taheri, Greg B. Thompson, Michael Uchic, Xun Li WangGary Was

^*Corresponding author for this work