Towards building a structure-properties prediction tool for nanodielectrics

Aditya S. Prasad; Linda Schadler; He Zhao; Xiaolin Li; Wei Chen; L Catherine Brinson

doi:10.1109/CEIDP.2017.8257600

Towards building a structure-properties prediction tool for nanodielectrics

Aditya S. Prasad, Linda Schadler, He Zhao, Xiaolin Li, Wei Chen, L Catherine Brinson

Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

PMMA based nanocomposites with 2 wt% silica nanoparticle loading were used as a model amorphous thermoplastic system to study the impact of melt mixing conditions on nanofiller dispersion and dielectric properties. The filler dispersion was varied by altering the filler/matrix enthalpic attraction with short molecules on the nanofiller surface and varying the extruder processing conditions. The nanofiller dispersion was quantified using TEM images and quantitative image analysis of interfacial area and cluster size. Trends between dispersion and dielectric properties (dielectric breakdown strength and permittivity) were studied.

Original language	English (US)
Title of host publication	CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	38-41
Number of pages	4
ISBN (Electronic)	9781538611944
DOIs	https://doi.org/10.1109/CEIDP.2017.8257600
State	Published - Jul 1 2017
Event	2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017 - Texas, United States Duration: Oct 22 2017 → Oct 25 2017

Publication series

Name	Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Volume	2017-October
ISSN (Print)	0084-9162

Other

Other	2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017
Country/Territory	United States
City	Texas
Period	10/22/17 → 10/25/17

Funding

This work is supported by NSF under 1310292 and 1334929. This work is supported by NSF under grants 1333977, 1310292and 1334929.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/CEIDP.2017.8257600

Cite this

Prasad, A. S., Schadler, L., Zhao, H., Li, X., Chen, W., & Brinson, L. C. (2017). Towards building a structure-properties prediction tool for nanodielectrics. In CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon (pp. 38-41). (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; Vol. 2017-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CEIDP.2017.8257600

Prasad, Aditya S. ; Schadler, Linda ; Zhao, He et al. / Towards building a structure-properties prediction tool for nanodielectrics. CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 38-41 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP).

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title = "Towards building a structure-properties prediction tool for nanodielectrics",

abstract = "PMMA based nanocomposites with 2 wt% silica nanoparticle loading were used as a model amorphous thermoplastic system to study the impact of melt mixing conditions on nanofiller dispersion and dielectric properties. The filler dispersion was varied by altering the filler/matrix enthalpic attraction with short molecules on the nanofiller surface and varying the extruder processing conditions. The nanofiller dispersion was quantified using TEM images and quantitative image analysis of interfacial area and cluster size. Trends between dispersion and dielectric properties (dielectric breakdown strength and permittivity) were studied.",

author = "Prasad, {Aditya S.} and Linda Schadler and He Zhao and Xiaolin Li and Wei Chen and Brinson, {L Catherine}",

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Prasad, AS, Schadler, L, Zhao, H, Li, X, Chen, W & Brinson, LC 2017, Towards building a structure-properties prediction tool for nanodielectrics. in CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon. Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, vol. 2017-October, Institute of Electrical and Electronics Engineers Inc., pp. 38-41, 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017, Texas, United States, 10/22/17. https://doi.org/10.1109/CEIDP.2017.8257600

Towards building a structure-properties prediction tool for nanodielectrics. / Prasad, Aditya S.; Schadler, Linda; Zhao, He et al.
CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon. Institute of Electrical and Electronics Engineers Inc., 2017. p. 38-41 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; Vol. 2017-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - PMMA based nanocomposites with 2 wt% silica nanoparticle loading were used as a model amorphous thermoplastic system to study the impact of melt mixing conditions on nanofiller dispersion and dielectric properties. The filler dispersion was varied by altering the filler/matrix enthalpic attraction with short molecules on the nanofiller surface and varying the extruder processing conditions. The nanofiller dispersion was quantified using TEM images and quantitative image analysis of interfacial area and cluster size. Trends between dispersion and dielectric properties (dielectric breakdown strength and permittivity) were studied.

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Prasad AS, Schadler L, Zhao H, Li X, Chen W, Brinson LC. Towards building a structure-properties prediction tool for nanodielectrics. In CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon. Institute of Electrical and Electronics Engineers Inc. 2017. p. 38-41. (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP). doi: 10.1109/CEIDP.2017.8257600

Towards building a structure-properties prediction tool for nanodielectrics

Abstract

Publication series

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Funding

ASJC Scopus subject areas

Access to Document

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