Towards quantum imaging with intensity squeezed light

Haechan An; Hamza Ather; Ali Shakouri; Mahdi Hosseini

doi:10.1117/12.3011697

Towards quantum imaging with intensity squeezed light

Haechan An, Hamza Ather, Ali Shakouri, Mahdi Hosseini^*

^*Corresponding author for this work

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We apply intensity squeezed light to thermoreflectivity sensing in electronic devices. We develop a scanning-based quantum imaging technique to study hot spots and heat dissipation in electronic devices with sub-shot-noise sensitivity.

Original language	English (US)
Title of host publication	Quantum Sensing, Imaging, and Precision Metrology II
Editors	Jacob Scheuer, Selim M. Shahriar
Publisher	SPIE
ISBN (Electronic)	9781510670846
DOIs	https://doi.org/10.1117/12.3011697
State	Published - 2024
Event	Quantum Sensing, Imaging, and Precision Metrology II 2024 - San Francisco, United States Duration: Jan 27 2024 → Feb 1 2024

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	12912
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Quantum Sensing, Imaging, and Precision Metrology II 2024
Country/Territory	United States
City	San Francisco
Period	1/27/24 → 2/1/24

Keywords

quantum imaging
squeezed light
thermoreflectivity

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.3011697

Cite this

@inproceedings{b41e79d996dd40b89b570192a859f60d,

title = "Towards quantum imaging with intensity squeezed light",

abstract = "We apply intensity squeezed light to thermoreflectivity sensing in electronic devices. We develop a scanning-based quantum imaging technique to study hot spots and heat dissipation in electronic devices with sub-shot-noise sensitivity.",

keywords = "quantum imaging, squeezed light, thermoreflectivity",

author = "Haechan An and Hamza Ather and Ali Shakouri and Mahdi Hosseini",

year = "2024",

doi = "10.1117/12.3011697",

language = "English (US)",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Jacob Scheuer and Shahriar, {Selim M.}",

booktitle = "Quantum Sensing, Imaging, and Precision Metrology II",

}

An, H, Ather, H, Shakouri, A & Hosseini, M 2024, Towards quantum imaging with intensity squeezed light. in J Scheuer & SM Shahriar (eds), Quantum Sensing, Imaging, and Precision Metrology II., 129120D, Proceedings of SPIE - The International Society for Optical Engineering, vol. 12912, SPIE, Quantum Sensing, Imaging, and Precision Metrology II 2024, San Francisco, United States, 1/27/24. https://doi.org/10.1117/12.3011697

Towards quantum imaging with intensity squeezed light. / An, Haechan; Ather, Hamza; Shakouri, Ali et al.
Quantum Sensing, Imaging, and Precision Metrology II. ed. / Jacob Scheuer; Selim M. Shahriar. SPIE, 2024. 129120D (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 12912).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Towards quantum imaging with intensity squeezed light

AU - An, Haechan

AU - Ather, Hamza

AU - Shakouri, Ali

AU - Hosseini, Mahdi

PY - 2024

Y1 - 2024

N2 - We apply intensity squeezed light to thermoreflectivity sensing in electronic devices. We develop a scanning-based quantum imaging technique to study hot spots and heat dissipation in electronic devices with sub-shot-noise sensitivity.

AB - We apply intensity squeezed light to thermoreflectivity sensing in electronic devices. We develop a scanning-based quantum imaging technique to study hot spots and heat dissipation in electronic devices with sub-shot-noise sensitivity.

KW - quantum imaging

KW - squeezed light

KW - thermoreflectivity

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U2 - 10.1117/12.3011697

DO - 10.1117/12.3011697

M3 - Conference contribution

AN - SCOPUS:85191655529

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Quantum Sensing, Imaging, and Precision Metrology II

A2 - Scheuer, Jacob

A2 - Shahriar, Selim M.

PB - SPIE

T2 - Quantum Sensing, Imaging, and Precision Metrology II 2024

Y2 - 27 January 2024 through 1 February 2024

ER -

Towards quantum imaging with intensity squeezed light

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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