Abstract
We apply intensity squeezed light to thermoreflectivity sensing in electronic devices. We develop a scanning-based quantum imaging technique to study hot spots and heat dissipation in electronic devices with sub-shot-noise sensitivity.
| Original language | English (US) |
|---|---|
| Title of host publication | Quantum Sensing, Imaging, and Precision Metrology II |
| Editors | Jacob Scheuer, Selim M. Shahriar |
| Publisher | SPIE |
| ISBN (Electronic) | 9781510670846 |
| DOIs | |
| State | Published - 2024 |
| Event | Quantum Sensing, Imaging, and Precision Metrology II 2024 - San Francisco, United States Duration: Jan 27 2024 → Feb 1 2024 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 12912 |
| ISSN (Print) | 0277-786X |
| ISSN (Electronic) | 1996-756X |
Conference
| Conference | Quantum Sensing, Imaging, and Precision Metrology II 2024 |
|---|---|
| Country/Territory | United States |
| City | San Francisco |
| Period | 1/27/24 → 2/1/24 |
Funding
We acknowledge funding from the National Science Foundation CAREER Award number: 2144356 and DoDNDEP Award number HQ0034-21-1-0014. We also acknowledge the early contribution of Hal Owens and Sami Alajlouni.
Keywords
- quantum imaging
- squeezed light
- thermoreflectivity
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering