Transmission EELS of oxide superconductors with a cold field emission TEM

Y. Y. Wang*, H. Zhang, V. P. Dravid

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

Electron energy loss spectrometry (EELS) with a cold field emission gun (cFEG) transmission electron microscope (TEM) is implemented to analyze the evolution of the electronic structure and dielectric function of oxide superconductors. The O‐K core loss spectra of p‐type doped oxide superconductors are analyzed in terms of holes formation on oxygen sites, while low loss spectra are analyzed for free carrier plasmas, other spectral excitations, and their crystallographic confinement. It is illustrated that the transmission EELS with a cFEG TEM very much complement soft X‐ray absorption spectroscopy and optical spectroscopy, with the added advantages of high spatial resolution (∼1–100 nm), and is compatible with other analytical, diffraction, and imaging techniques, which are readily available in a cFEG TEM. © 1995 Wiley‐Liss, Inc.

Original languageEnglish (US)
Pages (from-to)208-217
Number of pages10
JournalMicroscopy Research and Technique
Volume30
Issue number3
DOIs
StatePublished - Feb 15 1995

Keywords

  • Electron energy loss spectrometry
  • Superconductors
  • Transmission electron microscope

ASJC Scopus subject areas

  • Anatomy
  • Histology
  • Instrumentation
  • Medical Laboratory Technology

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