Transmission EELS of oxide superconductors with a cold field emission TEM

Y. Y. Wang; H. Zhang; V. P. Dravid

doi:10.1002/jemt.1070300303

Transmission EELS of oxide superconductors with a cold field emission TEM

Y. Y. Wang^*, H. Zhang, V. P. Dravid

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Electron energy loss spectrometry (EELS) with a cold field emission gun (cFEG) transmission electron microscope (TEM) is implemented to analyze the evolution of the electronic structure and dielectric function of oxide superconductors. The O‐K core loss spectra of p‐type doped oxide superconductors are analyzed in terms of holes formation on oxygen sites, while low loss spectra are analyzed for free carrier plasmas, other spectral excitations, and their crystallographic confinement. It is illustrated that the transmission EELS with a cFEG TEM very much complement soft X‐ray absorption spectroscopy and optical spectroscopy, with the added advantages of high spatial resolution (∼1–100 nm), and is compatible with other analytical, diffraction, and imaging techniques, which are readily available in a cFEG TEM. © 1995 Wiley‐Liss, Inc.

Original language	English (US)
Pages (from-to)	208-217
Number of pages	10
Journal	Microscopy Research and Technique
Volume	30
Issue number	3
DOIs	https://doi.org/10.1002/jemt.1070300303
State	Published - Feb 15 1995

Keywords

Electron energy loss spectrometry
Superconductors
Transmission electron microscope

ASJC Scopus subject areas

Anatomy
Histology
Instrumentation
Medical Laboratory Technology

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10.1002/jemt.1070300303

Cite this

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title = "Transmission EELS of oxide superconductors with a cold field emission TEM",

abstract = "Electron energy loss spectrometry (EELS) with a cold field emission gun (cFEG) transmission electron microscope (TEM) is implemented to analyze the evolution of the electronic structure and dielectric function of oxide superconductors. The O‐K core loss spectra of p‐type doped oxide superconductors are analyzed in terms of holes formation on oxygen sites, while low loss spectra are analyzed for free carrier plasmas, other spectral excitations, and their crystallographic confinement. It is illustrated that the transmission EELS with a cFEG TEM very much complement soft X‐ray absorption spectroscopy and optical spectroscopy, with the added advantages of high spatial resolution (∼1–100 nm), and is compatible with other analytical, diffraction, and imaging techniques, which are readily available in a cFEG TEM. {\textcopyright} 1995 Wiley‐Liss, Inc.",

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T1 - Transmission EELS of oxide superconductors with a cold field emission TEM

AU - Wang, Y. Y.

AU - Zhang, H.

AU - Dravid, V. P.

PY - 1995/2/15

Y1 - 1995/2/15

N2 - Electron energy loss spectrometry (EELS) with a cold field emission gun (cFEG) transmission electron microscope (TEM) is implemented to analyze the evolution of the electronic structure and dielectric function of oxide superconductors. The O‐K core loss spectra of p‐type doped oxide superconductors are analyzed in terms of holes formation on oxygen sites, while low loss spectra are analyzed for free carrier plasmas, other spectral excitations, and their crystallographic confinement. It is illustrated that the transmission EELS with a cFEG TEM very much complement soft X‐ray absorption spectroscopy and optical spectroscopy, with the added advantages of high spatial resolution (∼1–100 nm), and is compatible with other analytical, diffraction, and imaging techniques, which are readily available in a cFEG TEM. © 1995 Wiley‐Liss, Inc.

AB - Electron energy loss spectrometry (EELS) with a cold field emission gun (cFEG) transmission electron microscope (TEM) is implemented to analyze the evolution of the electronic structure and dielectric function of oxide superconductors. The O‐K core loss spectra of p‐type doped oxide superconductors are analyzed in terms of holes formation on oxygen sites, while low loss spectra are analyzed for free carrier plasmas, other spectral excitations, and their crystallographic confinement. It is illustrated that the transmission EELS with a cFEG TEM very much complement soft X‐ray absorption spectroscopy and optical spectroscopy, with the added advantages of high spatial resolution (∼1–100 nm), and is compatible with other analytical, diffraction, and imaging techniques, which are readily available in a cFEG TEM. © 1995 Wiley‐Liss, Inc.

KW - Electron energy loss spectrometry

KW - Superconductors

KW - Transmission electron microscope

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Transmission EELS of oxide superconductors with a cold field emission TEM

Abstract

Keywords

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