Transmission electron microscopy of multilayer thin films

Amanda K. Petford-Long, Ann N. Chiaramonti

Research output: Chapter in Book/Report/Conference proceedingChapter

17 Scopus citations

Abstract

The unique geometry of multilayer thin films, with layer thicknesses on the nanoscale, gives rise to a wide range of novel properties and behavior that are not observed in the bulk. The novel behavior is critically dependent on the microstructure of the films. This paper reviews the use of a range of transmission electron microscopy (TEM) techniques to elucidate the structure, chemistry, and properties of multilayer thin films. The paper includes a brief introduction to the technological applications to which multilayer thin films are suited, followed by a description of the various TEM techniques. The final section of the paper presents the application of these techniques to various multilayer thin film systems.

Original languageEnglish (US)
Title of host publicationAnnual Review of Materials Research
EditorsDavid Clarke, Manfred Ruehle, Antoni Tomsia
Pages559-584
Number of pages26
DOIs
StatePublished - Sep 1 2008

Publication series

NameAnnual Review of Materials Research
Volume38
ISSN (Print)1531-7331

Keywords

  • Characterization
  • Confinement effects
  • Interfaces
  • Layered structures
  • Microstructure

ASJC Scopus subject areas

  • Materials Science(all)

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  • Cite this

    Petford-Long, A. K., & Chiaramonti, A. N. (2008). Transmission electron microscopy of multilayer thin films. In D. Clarke, M. Ruehle, & A. Tomsia (Eds.), Annual Review of Materials Research (pp. 559-584). (Annual Review of Materials Research; Vol. 38). https://doi.org/10.1146/annurev.matsci.38.060407.130326