Abstract
Application of two-dimensional transverse cross-section quantum-well resolving nanopotentiometry technique, to a buried-heterostructure multiple-quantum-well-laser under forward operating bias, was presented. The laser was set under operation by applying variable bias voltages externally. A conductive probe was scanned in contact mode over the cross section of the device. Results demonstrated the utility of two dimensional nanopotentiometry to delineate quantitatively the transverse cross-sectional structure of complex two-dimensional devices.
Original language | English (US) |
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Pages | 295-296 |
Number of pages | 2 |
State | Published - 2002 |
Event | Conference on Lasers and Electro-Optics (CLEO 2002) - Long Beach, CA, United States Duration: May 19 2002 → May 24 2002 |
Other
Other | Conference on Lasers and Electro-Optics (CLEO 2002) |
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Country/Territory | United States |
City | Long Beach, CA |
Period | 5/19/02 → 5/24/02 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering