UHV-HREM and diffraction of surfaces

G. Jayaram*, R. Plass, Laurence Marks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

Characterization of the structure of surfaces is very important in order to develop a fundamental understanding of the electronic, mechanical and chemical properties of a material. While transmission electron microscopy imaging (TEM) and diffraction (TED) techniques are capable of providing surface structural information at the atomic level, such data would be suspect if obtained under conventional vacuum conditions (10-6-10-8 Torr). Ultrahigh vacuum (UHV) conditions are imperative during both preparation and observation of clean surfaces/interfaces. Conventional TEM techniques are very powerful for UHV-TEM investigations; however, the marriage of surface science and conventional TEM to yield an UHV-TEM is a complex task. These complexities and some of the results obtained using UHV-TEM and UHV-TED techniques for surfaces i.e. solid-vacuum interfaces will be illustrated.

Original languageEnglish (US)
Pages (from-to)379-395
Number of pages17
JournalInterface Science
Volume2
Issue number4
DOIs
StatePublished - Dec 1 1995

Keywords

  • electron diffraction
  • surfaces
  • transmission electron microscopy (TEM) imaging
  • ultrahigh vacuum (UHV)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics

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