Abstract
Results are reported using UHV electron microscopy to determine the role of background gases in influencing surface damage experiments and on the gold (001) surface prepared by ion-beam cleaning/thinning and annealing. In maximum valence oxides the end product is a higher-symmetry oxide or metal in UHV, but in a non-UHV environment secondary reactions take place. No evidence is found for electronic damage of non-maximal valence oxides, only sputtering and electron-stimulated reactions. For the gold (001) surface we have reproduced conventional surface-science preparations using ion-beam cleaning and annealing to produce the known reconstructed hexagonal monolayer on the surface.
Original language | English (US) |
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Pages (from-to) | 90-102 |
Number of pages | 13 |
Journal | Ultramicroscopy |
Volume | 37 |
Issue number | 1-4 |
DOIs | |
State | Published - Aug 1991 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation