Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Y. M. Kim, A. Hatt, A. Kumar, I. Ivanov, A. Morozovska, A. Tselev, Y. H. Chu, P. Yu, M. D. Biegalski, R. Ramesh, E. Eliseev, S. J. Pennycook, J. Rondinelli, S. V. Kalinin, A. Y. Borisevich

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)412-413
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - Jul 2012

ASJC Scopus subject areas

  • Instrumentation

Cite this

Kim, Y. M., Hatt, A., Kumar, A., Ivanov, I., Morozovska, A., Tselev, A., Chu, Y. H., Yu, P., Biegalski, M. D., Ramesh, R., Eliseev, E., Pennycook, S. J., Rondinelli, J., Kalinin, S. V., & Borisevich, A. Y. (2012). Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect. Microscopy and Microanalysis, 18, 412-413. https://doi.org/10.1017/S1431927612003911