Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Y. M. Kim; A. Hatt; A. Kumar; I. Ivanov; A. Morozovska; A. Tselev; Y. H. Chu; P. Yu; M. D. Biegalski; R. Ramesh; E. Eliseev; S. J. Pennycook; J. Rondinelli; S. V. Kalinin; A. Y. Borisevich

doi:10.1017/S1431927612003911

Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

Y. M. Kim, A. Hatt, A. Kumar, I. Ivanov, A. Morozovska, A. Tselev, Y. H. Chu, P. Yu, M. D. Biegalski, R. Ramesh, E. Eliseev, S. J. Pennycook, J. Rondinelli, S. V. Kalinin, A. Y. Borisevich

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	412-413
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612003911
State	Published - Jul 2012

ASJC Scopus subject areas

Instrumentation

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Kim, Y. M., Hatt, A., Kumar, A., Ivanov, I., Morozovska, A., Tselev, A., Chu, Y. H., Yu, P., Biegalski, M. D., Ramesh, R., Eliseev, E., Pennycook, S. J., Rondinelli, J., Kalinin, S. V., & Borisevich, A. Y. (2012). Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect. Microscopy and Microanalysis, 18, 412-413. https://doi.org/10.1017/S1431927612003911

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title = "Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect",

author = "Kim, {Y. M.} and A. Hatt and A. Kumar and I. Ivanov and A. Morozovska and A. Tselev and Chu, {Y. H.} and P. Yu and Biegalski, {M. D.} and R. Ramesh and E. Eliseev and Pennycook, {S. J.} and J. Rondinelli and Kalinin, {S. V.} and Borisevich, {A. Y.}",

year = "2012",

month = jul,

doi = "10.1017/S1431927612003911",

language = "English (US)",

volume = "18",

pages = "412--413",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

Kim, YM, Hatt, A, Kumar, A, Ivanov, I, Morozovska, A, Tselev, A, Chu, YH, Yu, P, Biegalski, MD, Ramesh, R, Eliseev, E, Pennycook, SJ, Rondinelli, J, Kalinin, SV & Borisevich, AY 2012, 'Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect', Microscopy and Microanalysis, vol. 18, pp. 412-413. https://doi.org/10.1017/S1431927612003911

TY - JOUR

T1 - Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

AU - Kim, Y. M.

AU - Hatt, A.

AU - Kumar, A.

AU - Ivanov, I.

AU - Morozovska, A.

AU - Tselev, A.

AU - Chu, Y. H.

AU - Yu, P.

AU - Biegalski, M. D.

AU - Ramesh, R.

AU - Eliseev, E.

AU - Pennycook, S. J.

AU - Rondinelli, J.

AU - Kalinin, S. V.

AU - Borisevich, A. Y.

PY - 2012/7

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U2 - 10.1017/S1431927612003911

DO - 10.1017/S1431927612003911

M3 - Article

AN - SCOPUS:85007947186

SN - 1431-9276

VL - 18

SP - 412

EP - 413

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Unconventional Antiferroelectric Phase Stabilization in Thin Film BiFeO3 by Interface-Induced Rotoelectric Coupling Effect

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