Abstract
Multislice ptychography is a high-resolution microscopy technique used to image multiple separate axial planes using a single illumination direction. However, multislice ptychography reconstructions are often degraded by crosstalk, where some features on one plane erroneously contribute to the reconstructed image of another plane. Here, the use of a modified 'double deep image prior' (DDIP) architecture is demonstrated in mitigating crosstalk artifacts in multislice ptychography. Utilizing the tendency of generative neural networks to produce natural images, a modified DDIP method yielded good results on experimental data. For one of the datasets, it is shown that using DDIP could remove the need of using additional experimental data, such as from X-ray fluorescence, to suppress the crosstalk. This method may help X-ray multislice ptychography work for more general experimental scenarios.
Original language | English (US) |
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Pages (from-to) | 1137-1145 |
Number of pages | 9 |
Journal | Journal of Synchrotron Radiation |
Volume | 28 |
DOIs | |
State | Published - Jul 1 2021 |
Funding
Funding for this research was provided by: Argonne National Laboratory (grant No. 2019-0441); National Institute of Mental Health (grant No. R01 MH115265). This research used resources of the Advanced Photon Source (APS), a US Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. It also used 3ID of the National Synchrotron Light Source II, a US Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DESC0012704. We appreciate the authors of the ‘double-DIP’ paper (Gandelsman et al., 2018) for sharing their code, which we adapted and modified for this work. The authors declare no conflicts of interest.
Keywords
- Artifact removal
- Image processing
- Multislice
- Neural network
- Ptychography
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation
- Radiation