Abstract
Impedance matching at the surface of left-handed materials (LHM) is required for certain applications including a perfect lens. In this study, we present the experimental and theoretical verification of an impedance-matched LHM to free space. Reflection characteristics of both one-dimensional and two-dimensional LHM were investigated. The reflection was observed to be very low at a narrow frequency range. FDTD simulations and retrieval procedures were used to theoretically verify impedance matching. By varying the number of layers along the propagation direction, the ultralow reflection at specific frequencies was shown to be independent of the sample thickness.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2548-2552 |
| Number of pages | 5 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 48 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 2006 |
Keywords
- Impedance matching
- Left-handed materials
- Metamaterials
- Perfect lens
- Reflection
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering