Abstract
Very high purity InP epilayers have been grown by low pressure metal organic chemical vapor deposition using trimethylindium as indium source. Residual doping levels as low as 3.1013 cm-3, with Hall mobility higher than 150,000 cm2/V.s at low temperatures, have been measured. It is claimed that photoluminescence at 2 K showed that these are the purest InP epilayers that have been reported in the literature.
Translated title of the contribution | Very high purity InP layers grown by low pressure metallorganic chemical vapor deposition |
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Original language | French |
Pages (from-to) | 191-211 |
Number of pages | 21 |
Journal | Revue technique - Thomson-CSF |
Volume | 20-21 |
Issue number | 2 |
State | Published - Jun 1 1989 |
ASJC Scopus subject areas
- General Engineering