Voltage noise in production processors

Vijay Janapa Reddi; Svilen Kanev; Wonyoung Kim; Simone Campanoni; Michael D. Smith; Gu Yeon Wei; David Brooks

doi:10.1109/MM.2010.104

Voltage noise in production processors

Vijay Janapa Reddi^*, Svilen Kanev, Wonyoung Kim, Simone Campanoni, Michael D. Smith, Gu Yeon Wei, David Brooks

^*Corresponding author for this work

Computer Science

Research output: Contribution to journal › Article

12 Scopus citations

Abstract

Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

Original language	English (US)
Article number	5661758
Pages (from-to)	20-28
Number of pages	9
Journal	IEEE Micro
Volume	31
Issue number	1
DOIs	https://doi.org/10.1109/MM.2010.104
State	Published - Jan 2011

Keywords

Software thread scheduling
dI/dt
inductive noise
processor design
voltage margins

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/MM.2010.104

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Janapa Reddi, V., Kanev, S., Kim, W., Campanoni, S., Smith, M. D., Wei, G. Y., & Brooks, D. (2011). Voltage noise in production processors. IEEE Micro, 31(1), 20-28. [5661758]. https://doi.org/10.1109/MM.2010.104

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