Voltage noise in production processors

Vijay Janapa Reddi*, Svilen Kanev, Wonyoung Kim, Simone Campanoni, Michael D. Smith, Gu Yeon Wei, David Brooks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Scopus citations


Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

Original languageEnglish (US)
Article number5661758
Pages (from-to)20-28
Number of pages9
JournalIEEE Micro
Issue number1
StatePublished - Jan 2011


  • Software thread scheduling
  • dI/dt
  • inductive noise
  • processor design
  • voltage margins

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering


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