Voltage noise in production processors

Vijay Janapa Reddi*, Svilen Kanev, Wonyoung Kim, Simone Campanoni, Michael D. Smith, Gu Yeon Wei, David Brooks

*Corresponding author for this work

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

Original languageEnglish (US)
Article number5661758
Pages (from-to)20-28
Number of pages9
JournalIEEE Micro
Volume31
Issue number1
DOIs
StatePublished - Jan 2011

Keywords

  • Software thread scheduling
  • dI/dt
  • inductive noise
  • processor design
  • voltage margins

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Voltage noise in production processors'. Together they form a unique fingerprint.

  • Cite this

    Janapa Reddi, V., Kanev, S., Kim, W., Campanoni, S., Smith, M. D., Wei, G. Y., & Brooks, D. (2011). Voltage noise in production processors. IEEE Micro, 31(1), 20-28. [5661758]. https://doi.org/10.1109/MM.2010.104