Voltage noise in production processors

Vijay Janapa Reddi; Svilen Kanev; Wonyoung Kim; Simone Campanoni; Michael D. Smith; Gu Yeon Wei; David Brooks

doi:10.1109/MM.2010.104

Voltage noise in production processors

Vijay Janapa Reddi^*, Svilen Kanev, Wonyoung Kim, Simone Campanoni, Michael D. Smith, Gu Yeon Wei, David Brooks

^*Corresponding author for this work

Computer Science

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

Original language	English (US)
Article number	5661758
Pages (from-to)	20-28
Number of pages	9
Journal	IEEE Micro
Volume	31
Issue number	1
DOIs	https://doi.org/10.1109/MM.2010.104
State	Published - Jan 2011

Keywords

Software thread scheduling
dI/dt
inductive noise
processor design
voltage margins

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/MM.2010.104

Cite this

@article{921c678b12c6411290119075aaa1e2a0,

title = "Voltage noise in production processors",

abstract = "Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.",

keywords = "Software thread scheduling, dI/dt, inductive noise, processor design, voltage margins",

author = "{Janapa Reddi}, Vijay and Svilen Kanev and Wonyoung Kim and Simone Campanoni and Smith, {Michael D.} and Wei, {Gu Yeon} and David Brooks",

year = "2011",

month = jan,

doi = "10.1109/MM.2010.104",

language = "English (US)",

volume = "31",

pages = "20--28",

journal = "IEEE Micro",

issn = "0272-1732",

publisher = "IEEE Computer Society",

number = "1",

}

TY - JOUR

T1 - Voltage noise in production processors

AU - Janapa Reddi, Vijay

AU - Kanev, Svilen

AU - Kim, Wonyoung

AU - Campanoni, Simone

AU - Smith, Michael D.

AU - Wei, Gu Yeon

AU - Brooks, David

PY - 2011/1

Y1 - 2011/1

N2 - Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

AB - Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

KW - Software thread scheduling

KW - dI/dt

KW - inductive noise

KW - processor design

KW - voltage margins

UR - http://www.scopus.com/inward/record.url?scp=79951836839&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79951836839&partnerID=8YFLogxK

U2 - 10.1109/MM.2010.104

DO - 10.1109/MM.2010.104

M3 - Article

AN - SCOPUS:79951836839

VL - 31

SP - 20

EP - 28

JO - IEEE Micro

JF - IEEE Micro

SN - 0272-1732

IS - 1

M1 - 5661758

ER -

Voltage noise in production processors

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this