Abstract
The knowledge of the structural and electronic surface morphology is imperative to fully understand the charge transfer at interfaces of electronic devices, such as in photovoltaic (PV) cells. To this aim, here, we use low-energy electron microscopy to probe the unoccupied states of post-annealed MoOx thin-films grown in oxygen excess (x∼3.16) and deficient (x∼2.57) environments. 2D work function maps are correlated with the surface topography extracted by mirror electron microscopy (MEM) mode, which show homogenous surface morphology and electronic levels for the specimen with x∼2.57, while it demonstrates nanoaggregates with different work functions on top of flat surface areas for the sample grown with x∼3.16.
Original language | English (US) |
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Pages (from-to) | 1339-1351 |
Number of pages | 13 |
Journal | Ultramicroscopy |
Volume | 183 |
DOIs | |
State | Published - Dec 2017 |
Funding
A.L.F.C. thanks the CNPq Brazilian Council for providing a scholarship under Process no 213909-2012-0. Work at the Molecular Foundry was supported by the Office of Science , Office of Basic Energy Sciences , of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231 . The research leading to these results has received funding from the People Programme (Marie Curie Actions) of the European Union's Seventh Framework Programme FP7 / 2007–2013/under REA Grant Agreement No. 607232, THINFACE. A.L.F.C. thanks the CNPq Brazilian Council for providing a scholarship under Process no 213909-2012-0. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. The research leading to these results has received funding from the People Programme (Marie Curie Actions) of the European Union's Seventh Framework Programme FP7/ 2007?2013/under REA Grant Agreement No. 607232, THINFACE.
Keywords
- Leem
- MoO thin-films
- Morphology
- Reactive sputtering
- Surface aggregation
- Work function
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation