X-ray analysis of Si/Ge/Si(001) heterolayer structures grown by surfactant mediated epitaxy

INIS

• films 100%
• x radiation 100%
• surfactants 100%
• epitaxy 66%
• standing waves 66%
• x-ray diffraction 33%
• applications 33%
• elasticity 33%
• diffraction 33%
• thickness 33%
• grazing 33%

Physics

• Surfactant 100%
• Standing Wave 66%
• Elasticity 33%
• X Ray Spectroscopy 33%
• Epitaxy 33%
• Grazing Incidence 33%
• Quality 33%
• Utilization 33%
• Fractions 33%
• Plane 33%

Material Science

• Surface Active Agent 100%
• Liquid Films 100%
• X-Ray Diffraction 66%
• Elastic Constant 33%
• Diffraction Measurement 33%