X-ray diffraction evidence of ordering in a normal liquid near the solid-liquid interface

C. J. Yu*, A. G. Richter, J. Kmetko, A. Datta, P. Dutta

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We have seen X-ray diffraction peaks establishing that the structure of normal liquids at solid-liquid interfaces is significantly different from the bulk structures. Wetting film thicknesses of ∼5000 Å were formed on silicon (111) surfaces with native oxide by pouring and draining the pure liquids; such films are thin enough for X-rays to penetrate easily, but thick enough to eliminate undesired fringes corresponding to the film thickness. The liquids studied were tetrakis(2-ethylhexoxy)silane (TEHOS) and tetrakis(trimethylsiloxy)silane (TTMSS). The observed diffraction peaks are in the specular direction, showing that the liquid molecules form layers parallel to the interface. The layer spacings are comparable to the molecular dimensions, and the peak widths indicate that there are 3-6 layers.

Original languageEnglish (US)
Pages (from-to)488-493
Number of pages6
JournalEurophysics Letters
Volume50
Issue number4
DOIs
StatePublished - May 11 2000

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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