X-ray interferometric solution of the surface registration problem

G. Materlik*, A. Frahm, M. J. Bedzyk

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

63 Scopus citations

Abstract

A Bonse-Hart x-ray interferometer was used to determine the (220) Fourier component of the distribution function of a chemisorbed submonolayer of bromine on a (111) silicon surface. This measurement demonstrates not only the presence of an x-ray interference field above the crystal surface of the analyzer of a Laue-case interferometer, but when coupled with Bragg-case standing-wave measurements also provides the means to determine uniquely the position of surface atoms relative to the bulk lattice.

Original languageEnglish (US)
Pages (from-to)441-444
Number of pages4
JournalPhysical review letters
Volume52
Issue number6
DOIs
StatePublished - 1984

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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