Abstract
The microstructures of beech wood and of beech wood-derived carbon, silicon carbide (SiC), and an aluminum/SiC composite were studied using both scanning electron microscopy (SEM) and synchrotron X-ray micro-computed tomography (μCT). As opposed to traditional two-dimensional imaging techniques, the μCT data allowed nondestructive evaluation of relatively large sample volumes. Nondestructive three-dimensional data analysis led to the observation of microstructural features, such as varying pore-wall topographies not previously seen in SEM, calculations of the volume fraction of porosity and characterization of the interconnectivity of porosity in the SiC material.
Original language | English (US) |
---|---|
Pages (from-to) | 1373-1389 |
Number of pages | 17 |
Journal | Philosophical Magazine |
Volume | 89 |
Issue number | 17 |
DOIs | |
State | Published - Jun 2009 |
Funding
Funding for this work was provided by National Science Foundation Grant DMR-0710630. Use of the Advanced Photon Source at Argonne National Laboratory was supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
Keywords
- Composite
- Silicone carbide
- Synchrotron
- Wood
- X-ray micro-computed tomography
ASJC Scopus subject areas
- Condensed Matter Physics