The microstructures of beech wood and of beech wood-derived carbon, silicon carbide (SiC), and an aluminum/SiC composite were studied using both scanning electron microscopy (SEM) and synchrotron X-ray micro-computed tomography (μCT). As opposed to traditional two-dimensional imaging techniques, the μCT data allowed nondestructive evaluation of relatively large sample volumes. Nondestructive three-dimensional data analysis led to the observation of microstructural features, such as varying pore-wall topographies not previously seen in SEM, calculations of the volume fraction of porosity and characterization of the interconnectivity of porosity in the SiC material.
- Silicone carbide
- X-ray micro-computed tomography
ASJC Scopus subject areas
- Condensed Matter Physics