INIS
x radiation
100%
silicon carbides
100%
computed tomography
100%
wood
100%
scanning electron microscopy
40%
volume
40%
microstructure
40%
porosity
40%
data
20%
data analysis
20%
walls
20%
carbon
20%
synchrotrons
20%
nondestructive analysis
20%
topography
20%
aluminum
20%
Material Science
Tomography
100%
Silicon Carbide
100%
Composite Material
100%
Wood
100%
Void Fraction
50%
Characterization
25%
Volume Fraction
25%
Non-Destructive Testing
25%
Silicon Carbide Material
25%
Aluminum
25%
Topography
25%
Microstructure
25%
Biochemistry, Genetics and Molecular Biology
X Ray
100%
Micro-Computed Tomography
100%
Porosity
66%
Scanning Electron Microscopy
66%
Volume
66%
Imaging Technique
33%
Computer Assisted Tomography
33%
Data Analysis
33%
Sample
33%