X-ray microbeam quantification of grain subdivision accompanying large deformations of copper

A. Guvenilir, G. C. Butler, J. D. Haase, D. L. Mcdowell, S. R. Stock*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

This work reports the application of X-ray microbeam diffraction to quantifying grain subdivision processes in copper. Polychromatic synchrotron X-radiation was used to study samples in the asreceived (low deformation) and 100% torsion strained material. The large range of domain disorientations (within individual grains) observed in the highly strained material agrees with results on other f.c.c. materials obtained by electron beam methods; it is not surprising, therefore, that models of texture development which do not include this effect predict too rapid sharpening of preferred orientation compared to experimental pole figures.

Original languageEnglish (US)
Pages (from-to)6599-6604
Number of pages6
JournalActa Materialia
Volume46
Issue number18
DOIs
StatePublished - Nov 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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