Abstract
This work reports the application of X-ray microbeam diffraction to quantifying grain subdivision processes in copper. Polychromatic synchrotron X-radiation was used to study samples in the asreceived (low deformation) and 100% torsion strained material. The large range of domain disorientations (within individual grains) observed in the highly strained material agrees with results on other f.c.c. materials obtained by electron beam methods; it is not surprising, therefore, that models of texture development which do not include this effect predict too rapid sharpening of preferred orientation compared to experimental pole figures.
Original language | English (US) |
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Pages (from-to) | 6599-6604 |
Number of pages | 6 |
Journal | Acta Materialia |
Volume | 46 |
Issue number | 18 |
DOIs | |
State | Published - Nov 1998 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Polymers and Plastics
- Metals and Alloys