Abstract
Polychromatic synchrotron x-ray microbeams offer a very efficient alternative to electron beam methods for quantifying the amount and character of grain subdivision accompanying large deformations. With a 0.01 mm diameter collimator, bending magnet radiation from a 3.0 GeV source and image storage plates, samples of copper with thicknesses greater than 0.1 mm have been studied. Results from an as-received sample and a sample deformed to 100% torsion are compared and illustrate how efficiently grain subdivision can be quantified with polychromatic microbeam diffraction.
Original language | English (US) |
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Pages (from-to) | 43-48 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 524 |
DOIs | |
State | Published - 1998 |
Event | Proceedings of the 1998 MRS Spring Meeting - San Francisco, CA, USA Duration: Apr 13 1998 → Apr 17 1998 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering