X-ray microbeam quantification of grain subdivision accompanying large deformations of copper

G. C. Butler*, A. Guvenilir, D. L. McDowell, S. R. Stock

*Corresponding author for this work

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

Polychromatic synchrotron x-ray microbeams offer a very efficient alternative to electron beam methods for quantifying the amount and character of grain subdivision accompanying large deformations. With a 0.01 mm diameter collimator, bending magnet radiation from a 3.0 GeV source and image storage plates, samples of copper with thicknesses greater than 0.1 mm have been studied. Results from an as-received sample and a sample deformed to 100% torsion are compared and illustrate how efficiently grain subdivision can be quantified with polychromatic microbeam diffraction.

Original languageEnglish (US)
Pages (from-to)43-48
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume524
StatePublished - Jan 1 1998
EventProceedings of the 1998 MRS Spring Meeting - San Francisco, CA, USA
Duration: Apr 13 1998Apr 17 1998

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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