X-ray microscopy and holography with third-generation sources

Chris J. Jacobsen*, Shawn P. Williams

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Certain types of x-ray microscopes require coherent beams of soft x-rays, and thus are amongst the most brightness-hungry of synchrotron radiation experiments. We consider here what advances third generation sources will and will not offer to several kinds of x-ray microscopes.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages108-116
Number of pages9
ISBN (Print)0819409138
StatePublished - Jan 1 1993
EventOptics for High-Brightness Synchrotron Radiation Beamlines - San Diego, CA, USA
Duration: Jul 23 1992Jul 24 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1740
ISSN (Print)0277-786X

Other

OtherOptics for High-Brightness Synchrotron Radiation Beamlines
CitySan Diego, CA, USA
Period7/23/927/24/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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