X-ray microscopy using FELs: possibilities and challenges

Chris Jacobsen*

*Corresponding author for this work

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

X-ray microscopy is often discussed as one of the experiments that would benefit from the development of x-ray free-electron lasers. We outline the source characteristics required for several different x-ray microscopy experiments, including possible approaches towards atomic resolution imaging. X-ray FELs would help many but not all of these experiments; those that would benefit the most include experiments that are extremely demanding of a high total flux of coherent x rays; experiments that require snapshot imaging at nanosecond or faster timescales; and pump-probe experiments that require synchronization of an x-ray and a UV laser pulse. In all of these experiments, caution must be taken with regard to radiation and thermal damage.

Original languageEnglish (US)
Pages (from-to)16-25
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3925
StatePublished - Jan 1 2000
EventBiomedical Applications of Free-Electron Lasers - San Jose, CA, USA
Duration: Jan 22 2000Jan 22 2000

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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