X-ray Microscopy with the NSLS Soft X-ray Undulator

Janos Kirz; Harald Ade; Chris Buckley; Sid Hellman; Chris Jacobsen; Steve Lindaas; Ian McNulty; Menno Oversluizen; Erik Anderson; David Attwood; Malcolm Howells; Stephen Rothman; Erik Anderson; Dieter Kern; David Sayre; Harvey Rarback; Mark Rivers; Deming Shu; Stephen Rothman; Chris Buckley; Deming Shu

doi:10.1088/0031-8949/1990/T31/001

X-ray Microscopy with the NSLS Soft X-ray Undulator

Janos Kirz^*, Harald Ade, Chris Buckley, Sid Hellman, Chris Jacobsen, Steve Lindaas, Ian McNulty, Menno Oversluizen, Erik Anderson, David Attwood, Malcolm Howells, Stephen Rothman, Erik Anderson, Dieter Kern, David Sayre, Harvey Rarback, Mark Rivers, Deming Shu, Stephen Rothman, Chris BuckleyDeming Shu

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Soft x-rays are attractive for microscopy because they tend to be less damaging to specimens than charged probes. In addition their interactions with specimens can result in element-specific information and the penetration depth is adjustable by choice of the beam energy. Resolution on the order of 50 nm has been demonstrated, and further improvements are anticipated. The experimental program at the NSLS X1A beamline is dedicated to soft x-ray microscopy. We are developing two types of instruments, both dependent on the remarkable brightness of the undulator source. One of these uses a Fresnel zone plate to focus the beam to a small size. This microprobe is used either to study biological specimens, or, in a different apparatus, to study surfaces by photoelectron microscopy. The other type of instrument makes use of x-rays diffracted by the specimen. In this category we are involved in the development of Gabor holography, Fourier transform holography, and in imaging by soft x-ray diffraction.

Original language	English (US)
Pages (from-to)	12-17
Number of pages	6
Journal	Physica Scripta
Volume	1990
Issue number	T31
DOIs	https://doi.org/10.1088/0031-8949/1990/T31/001
State	Published - Jan 1 1990

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Mathematical Physics
Condensed Matter Physics
General Physics and Astronomy

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10.1088/0031-8949/1990/T31/001

Cite this

Kirz, J., Ade, H., Buckley, C., Hellman, S., Jacobsen, C., Lindaas, S., McNulty, I., Oversluizen, M., Anderson, E., Attwood, D., Howells, M., Rothman, S., Anderson, E., Kern, D., Sayre, D., Rarback, H., Rivers, M., Shu, D., Rothman, S., ... Shu, D. (1990). X-ray Microscopy with the NSLS Soft X-ray Undulator. Physica Scripta, 1990(T31), 12-17. https://doi.org/10.1088/0031-8949/1990/T31/001

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title = "X-ray Microscopy with the NSLS Soft X-ray Undulator",

abstract = "Soft x-rays are attractive for microscopy because they tend to be less damaging to specimens than charged probes. In addition their interactions with specimens can result in element-specific information and the penetration depth is adjustable by choice of the beam energy. Resolution on the order of 50 nm has been demonstrated, and further improvements are anticipated. The experimental program at the NSLS X1A beamline is dedicated to soft x-ray microscopy. We are developing two types of instruments, both dependent on the remarkable brightness of the undulator source. One of these uses a Fresnel zone plate to focus the beam to a small size. This microprobe is used either to study biological specimens, or, in a different apparatus, to study surfaces by photoelectron microscopy. The other type of instrument makes use of x-rays diffracted by the specimen. In this category we are involved in the development of Gabor holography, Fourier transform holography, and in imaging by soft x-ray diffraction.",

author = "Janos Kirz and Harald Ade and Chris Buckley and Sid Hellman and Chris Jacobsen and Steve Lindaas and Ian McNulty and Menno Oversluizen and Erik Anderson and David Attwood and Malcolm Howells and Stephen Rothman and Erik Anderson and Dieter Kern and David Sayre and Harvey Rarback and Mark Rivers and Deming Shu and Stephen Rothman and Chris Buckley and Deming Shu",

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Kirz, J, Ade, H, Buckley, C, Hellman, S, Jacobsen, C, Lindaas, S, McNulty, I, Oversluizen, M, Anderson, E, Attwood, D, Howells, M, Rothman, S, Anderson, E, Kern, D, Sayre, D, Rarback, H, Rivers, M, Shu, D, Rothman, S, Buckley, C & Shu, D 1990, 'X-ray Microscopy with the NSLS Soft X-ray Undulator', Physica Scripta, vol. 1990, no. T31, pp. 12-17. https://doi.org/10.1088/0031-8949/1990/T31/001

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AU - Kirz, Janos

AU - Ade, Harald

AU - Buckley, Chris

AU - Hellman, Sid

AU - Jacobsen, Chris

AU - Lindaas, Steve

AU - McNulty, Ian

AU - Oversluizen, Menno

AU - Anderson, Erik

AU - Attwood, David

AU - Howells, Malcolm

AU - Rothman, Stephen

AU - Anderson, Erik

AU - Kern, Dieter

AU - Sayre, David

AU - Rarback, Harvey

AU - Rivers, Mark

AU - Shu, Deming

AU - Rothman, Stephen

AU - Buckley, Chris

AU - Shu, Deming

PY - 1990/1/1

Y1 - 1990/1/1

N2 - Soft x-rays are attractive for microscopy because they tend to be less damaging to specimens than charged probes. In addition their interactions with specimens can result in element-specific information and the penetration depth is adjustable by choice of the beam energy. Resolution on the order of 50 nm has been demonstrated, and further improvements are anticipated. The experimental program at the NSLS X1A beamline is dedicated to soft x-ray microscopy. We are developing two types of instruments, both dependent on the remarkable brightness of the undulator source. One of these uses a Fresnel zone plate to focus the beam to a small size. This microprobe is used either to study biological specimens, or, in a different apparatus, to study surfaces by photoelectron microscopy. The other type of instrument makes use of x-rays diffracted by the specimen. In this category we are involved in the development of Gabor holography, Fourier transform holography, and in imaging by soft x-ray diffraction.

AB - Soft x-rays are attractive for microscopy because they tend to be less damaging to specimens than charged probes. In addition their interactions with specimens can result in element-specific information and the penetration depth is adjustable by choice of the beam energy. Resolution on the order of 50 nm has been demonstrated, and further improvements are anticipated. The experimental program at the NSLS X1A beamline is dedicated to soft x-ray microscopy. We are developing two types of instruments, both dependent on the remarkable brightness of the undulator source. One of these uses a Fresnel zone plate to focus the beam to a small size. This microprobe is used either to study biological specimens, or, in a different apparatus, to study surfaces by photoelectron microscopy. The other type of instrument makes use of x-rays diffracted by the specimen. In this category we are involved in the development of Gabor holography, Fourier transform holography, and in imaging by soft x-ray diffraction.

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X-ray Microscopy with the NSLS Soft X-ray Undulator

Abstract

ASJC Scopus subject areas

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