X-ray Microscopy with the NSLS Soft X-ray Undulator

Janos Kirz*, Harald Ade, Chris Buckley, Sid Hellman, Chris Jacobsen, Steve Lindaas, Ian McNulty, Menno Oversluizen, Erik Anderson, David Attwood, Malcolm Howells, Stephen Rothman, Erik Anderson, Dieter Kern, David Sayre, Harvey Rarback, Mark Rivers, Deming Shu, Stephen Rothman, Chris BuckleyDeming Shu

*Corresponding author for this work

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Physics