Abstract
In this tutorial, we describe X-ray microtomography as a technique to nondestructively characterize material microstructure in three dimensions at a micron level spatial resolution. While commercially available laboratory scale instrumentation is available, we focus our attention on synchrotron-based systems, where we can exploit a high flux, monochromatic X-ray beam to produce high fidelity three-dimensional images. A brief description of the physics and the mathematical analysis behind the technique is followed by example applications to specific materials characterization problems, with a particular focus on the utilization of three-dimensional image processing that can be used to extract a wide range of useful information.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1305-1316 |
| Number of pages | 12 |
| Journal | Materials Characterization |
| Volume | 61 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 2010 |
Funding
Portions of this work were performed at the DuPont–Northwestern-Dow Collaborative Access Team (DND-CAT) located at Sector 5 of the Advanced Photon Source (APS). DND-CAT is supported by E.I. DuPont de Nemours & Co. , The Dow Chemical Company and the State of Illinois . Use of the APS was supported by the U. S. Department of Energy , Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357 .
Keywords
- 3D image processing
- Microtomography
- X-ray computed tomography
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering