X-ray microtomography

Eric N. Landis, Denis T. Keane

Research output: Contribution to journalShort surveypeer-review

477 Scopus citations

Abstract

In this tutorial, we describe X-ray microtomography as a technique to nondestructively characterize material microstructure in three dimensions at a micron level spatial resolution. While commercially available laboratory scale instrumentation is available, we focus our attention on synchrotron-based systems, where we can exploit a high flux, monochromatic X-ray beam to produce high fidelity three-dimensional images. A brief description of the physics and the mathematical analysis behind the technique is followed by example applications to specific materials characterization problems, with a particular focus on the utilization of three-dimensional image processing that can be used to extract a wide range of useful information.

Original languageEnglish (US)
Pages (from-to)1305-1316
Number of pages12
JournalMaterials Characterization
Volume61
Issue number12
DOIs
StatePublished - Dec 2010

Keywords

  • 3D image processing
  • Microtomography
  • X-ray computed tomography

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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