Abstract
In this tutorial, we describe X-ray microtomography as a technique to nondestructively characterize material microstructure in three dimensions at a micron level spatial resolution. While commercially available laboratory scale instrumentation is available, we focus our attention on synchrotron-based systems, where we can exploit a high flux, monochromatic X-ray beam to produce high fidelity three-dimensional images. A brief description of the physics and the mathematical analysis behind the technique is followed by example applications to specific materials characterization problems, with a particular focus on the utilization of three-dimensional image processing that can be used to extract a wide range of useful information.
Original language | English (US) |
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Pages (from-to) | 1305-1316 |
Number of pages | 12 |
Journal | Materials Characterization |
Volume | 61 |
Issue number | 12 |
DOIs | |
State | Published - Dec 2010 |
Keywords
- 3D image processing
- Microtomography
- X-ray computed tomography
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering