X-ray microtomography

Eric N. Landis, Denis T. Keane

    Research output: Contribution to journalShort surveypeer-review

    344 Scopus citations

    Abstract

    In this tutorial, we describe X-ray microtomography as a technique to nondestructively characterize material microstructure in three dimensions at a micron level spatial resolution. While commercially available laboratory scale instrumentation is available, we focus our attention on synchrotron-based systems, where we can exploit a high flux, monochromatic X-ray beam to produce high fidelity three-dimensional images. A brief description of the physics and the mathematical analysis behind the technique is followed by example applications to specific materials characterization problems, with a particular focus on the utilization of three-dimensional image processing that can be used to extract a wide range of useful information.

    Original languageEnglish (US)
    Pages (from-to)1305-1316
    Number of pages12
    JournalMaterials Characterization
    Volume61
    Issue number12
    DOIs
    StatePublished - Dec 2010

    Keywords

    • 3D image processing
    • Microtomography
    • X-ray computed tomography

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

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