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X-ray microtomography
Eric N. Landis, Denis T. Keane
Office for Research
Research output
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Contribution to journal
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Short survey
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peer-review
479
Scopus citations
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Keyphrases
X-ray Microtomography
100%
Material Characterization
50%
Spatial Resolution
50%
Synchrotron Techniques
50%
Commercially Available
50%
Mathematical Analysis
50%
X-ray Beam
50%
Material Microstructure
50%
3D Image
50%
Specific Material
50%
High Heat Flux
50%
Characterization Problem
50%
Monochromatic X-ray
50%
3D Image Processing
50%
Physics
Synchrotron
100%
Image Processing
100%
Physics
100%