X-ray reflectivity study of ultrathin liquid films of diphenylsiloxane- dimethylsiloxane copolymers

Guennadi Evmenenko*, Haiding Mo, Sumit Kewalramani, Pulak Dutta

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Using X-ray reflectivity, we observe drastic differences in the interfacial structure and molecular ordering of diphenylsiloxane - dimethylsiloxane copolymer thin films deposited on hydroxylated versus H-terminated (etched) silicon wafers. We find that substrate type and comonomer ratio determine the conformational arrangements in these liquid films. High-energy bonding between the substrate and the molecules and an increase in rigidity of the molecules due to replacement of methyl groups by phenyl groups leads to a specific molecular ordering at the liquid/solid interface and pronounced density oscillations in this region. The observed structural reorganizations are explained by the interplay and the established balance between the chain flexibility and the polymer-substrate interactions.

Original languageEnglish (US)
Pages (from-to)6245-6248
Number of pages4
JournalLangmuir
Volume22
Issue number14
DOIs
StatePublished - Jul 4 2006

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

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