X-ray scattering study of the surface structure

Osami Sakata, P. Lyman, B. Tinkham, D. Walko, D. Marasco, T. Lee, M. Bedzyk

Research output: Contribution to journalArticlepeer-review

12 Scopus citations


The (Formula presented) surface structure of Te adsorbed on Ge(001) was studied by analyzing the x-ray scattered intensity along several surface crystal truncation rods (CTR). The results were compared to simulations corresponding to the bridge, top, antibridge, and hollow site models. Te at the bridge site was in best agreement. More complex surface models based on modifications of Te at the bridge site were then compared to the data with the missing-row model being in better agreement than the zigzag model. Finally, the CTR data were used to refine the structural parameters of the missing row model.

Original languageEnglish (US)
Pages (from-to)16692-16696
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number24
StatePublished - 2000

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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