The (Formula presented) surface structure of Te adsorbed on Ge(001) was studied by analyzing the x-ray scattered intensity along several surface crystal truncation rods (CTR). The results were compared to simulations corresponding to the bridge, top, antibridge, and hollow site models. Te at the bridge site was in best agreement. More complex surface models based on modifications of Te at the bridge site were then compared to the data with the missing-row model being in better agreement than the zigzag model. Finally, the CTR data were used to refine the structural parameters of the missing row model.
|Original language||English (US)|
|Number of pages||5|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|State||Published - Jan 1 2000|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics