Abstract
The effect of longitudinal (or temporal) coherence on total reflection assisted x-ray standing wave (TR-XSW) analysis of nanoscale materials is quantitatively demonstrated by showing how the XSW fringe visibility can be strongly damped by decreasing the spectral resolution of the incident x-ray beam. The correction for nonzero wavelength dispersion (δλ0) of the incident x-ray wave field is accounted for in the model computations of TR-XSW assisted angle dependent fluorescence yields of the nanostructure coatings on x-ray mirror surfaces. Given examples include 90nm diameter Au nanospheres deposited on a Si(100) surface and a 3nm thick Zn layer trapped on top a 100nm Langmuir-Blodgett film coating on a Au mirror surface. Present method opens up important applications, such as enabling XSW studies of large dimensioned nanostructures using conventional laboratory based partially coherent x-ray sources.
Original language | English (US) |
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Article number | 103104 |
Journal | Applied Physics Letters |
Volume | 107 |
Issue number | 10 |
DOIs | |
State | Published - Sep 7 2015 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)