X-ray standing-wave analysis of the rare-earth atomic positions in RBa2Cu3O7-δ thin films

A. Kazimirov*, L. X. Cao, G. Scherb, L. Cheng, M. J. Bedzyk, J. Zegenhagen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations


We applied the X-ray standing-wave technique to study the lattice location of rare-earth atoms in thin films of RBa2Cu3O7-δ (R = Gd, Pr). The films had a thickness of 200 nm and were grown by pulsed laser deposition on SrTiO3(001) substrates. The standing wave was generated by kinematic Bragg diffraction. The angular dependence of the R-L and Ba-L fluorescence yield was recorded while scanning through the (005) Bragg reflection of the film. Analysis of the angular dependence leads to information on the degree of site interchange of R and Ba. We found a clear indication that Pr substitutes for Ba.

Original languageEnglish (US)
Pages (from-to)271-276
Number of pages6
JournalSolid State Communications
Issue number5
StatePublished - Apr 11 2000

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry


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