X-Ray Standing Wave at the Total Reflection Condition

Michael J Bedzyk

X-Ray Standing Wave at the Total Reflection Condition

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

Fresnel theory is used to derive the complex electric fields above and below an X-ray reflecting interface that separates two materials with differing refraction indices. The interference between the incident and reflected waves produces an X-ray standing wave (XSW) above the reflecting interface. The XSW intensity modulation is strongly enhanced by the total external reflection condition, which occurs at incident angles less than the critical angle. At these small milliradian incident angles, the XSW period (λ/2θ) becomes very large, which makes the TR-XSW an ideal probe for studying low-density structures that extend 1 to 1000 nm above the reflecting interface.

Read More: http://www.worldscientific.com/doi/abs/10.1142/9789812779014_0005

Original language	English (US)
Title of host publication	The X-Ray Standing Wave Technique: Principles and Applications
Editors	Jorg Zegenhagen, Alexander Kazimirov
Publisher	World Scientific Publishing Company
Pages	94-107
Number of pages	14
ISBN (Electronic)	978-981-4513-10-4
ISBN (Print)	978-981-277-900-7
State	Published - Apr 15 2015

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title = "X-Ray Standing Wave at the Total Reflection Condition",

abstract = "Fresnel theory is used to derive the complex electric fields above and below an X-ray reflecting interface that separates two materials with differing refraction indices. The interference between the incident and reflected waves produces an X-ray standing wave (XSW) above the reflecting interface. The XSW intensity modulation is strongly enhanced by the total external reflection condition, which occurs at incident angles less than the critical angle. At these small milliradian incident angles, the XSW period (λ/2θ) becomes very large, which makes the TR-XSW an ideal probe for studying low-density structures that extend 1 to 1000 nm above the reflecting interface.Read More: http://www.worldscientific.com/doi/abs/10.1142/9789812779014_0005",

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N2 - Fresnel theory is used to derive the complex electric fields above and below an X-ray reflecting interface that separates two materials with differing refraction indices. The interference between the incident and reflected waves produces an X-ray standing wave (XSW) above the reflecting interface. The XSW intensity modulation is strongly enhanced by the total external reflection condition, which occurs at incident angles less than the critical angle. At these small milliradian incident angles, the XSW period (λ/2θ) becomes very large, which makes the TR-XSW an ideal probe for studying low-density structures that extend 1 to 1000 nm above the reflecting interface.Read More: http://www.worldscientific.com/doi/abs/10.1142/9789812779014_0005

AB - Fresnel theory is used to derive the complex electric fields above and below an X-ray reflecting interface that separates two materials with differing refraction indices. The interference between the incident and reflected waves produces an X-ray standing wave (XSW) above the reflecting interface. The XSW intensity modulation is strongly enhanced by the total external reflection condition, which occurs at incident angles less than the critical angle. At these small milliradian incident angles, the XSW period (λ/2θ) becomes very large, which makes the TR-XSW an ideal probe for studying low-density structures that extend 1 to 1000 nm above the reflecting interface.Read More: http://www.worldscientific.com/doi/abs/10.1142/9789812779014_0005

M3 - Chapter

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SP - 94

EP - 107

BT - The X-Ray Standing Wave Technique: Principles and Applications

A2 - Zegenhagen, Jorg

A2 - Kazimirov, Alexander

PB - World Scientific Publishing Company

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