X-ray standing wave imaging of atoms at interfaces

Michael Bedzyk; Chang Yong Kim; Alexander Kazimirov; Jeffrey Elam; Steve Christensen; Dipak Goswami; Mark Hersam; Michael Pellin; Peter Stair

X-ray standing wave imaging of atoms at interfaces

Michael Bedzyk^*, Chang Yong Kim, Alexander Kazimirov, Jeffrey Elam, Steve Christensen, Dipak Goswami, Mark Hersam, Michael Pellin, Peter Stair

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes
Pages	337-361
Number of pages	25
State	Published - Dec 1 2006
Event	2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes - Boston, MA, United States Duration: Nov 27 2006 → Dec 1 2006

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	967
ISSN (Print)	0272-9172

Other

Other	2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes
Country/Territory	United States
City	Boston, MA
Period	11/27/06 → 12/1/06

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Cite this

Bedzyk, M., Kim, C. Y., Kazimirov, A., Elam, J., Christensen, S., Goswami, D., Hersam, M., Pellin, M., & Stair, P. (2006). X-ray standing wave imaging of atoms at interfaces. In Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes (pp. 337-361). (Materials Research Society Symposium Proceedings; Vol. 967).

@inproceedings{690d3188046d46ffa0076c9b02dec4d3,

title = "X-ray standing wave imaging of atoms at interfaces",

author = "Michael Bedzyk and Kim, {Chang Yong} and Alexander Kazimirov and Jeffrey Elam and Steve Christensen and Dipak Goswami and Mark Hersam and Michael Pellin and Peter Stair",

year = "2006",

month = dec,

day = "1",

language = "English (US)",

isbn = "9781604234350",

series = "Materials Research Society Symposium Proceedings",

pages = "337--361",

booktitle = "Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes",

note = "2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes ; Conference date: 27-11-2006 Through 01-12-2006",

}

Bedzyk, M, Kim, CY, Kazimirov, A, Elam, J, Christensen, S, Goswami, D, Hersam, M, Pellin, M & Stair, P 2006, X-ray standing wave imaging of atoms at interfaces. in Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes. Materials Research Society Symposium Proceedings, vol. 967, pp. 337-361, 2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes, Boston, MA, United States, 11/27/06.

X-ray standing wave imaging of atoms at interfaces. / Bedzyk, Michael; Kim, Chang Yong; Kazimirov, Alexander et al.
Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes. 2006. p. 337-361 (Materials Research Society Symposium Proceedings; Vol. 967).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - X-ray standing wave imaging of atoms at interfaces

AU - Bedzyk, Michael

AU - Kim, Chang Yong

AU - Kazimirov, Alexander

AU - Elam, Jeffrey

AU - Christensen, Steve

AU - Goswami, Dipak

AU - Hersam, Mark

AU - Pellin, Michael

AU - Stair, Peter

PY - 2006/12/1

Y1 - 2006/12/1

UR - http://www.scopus.com/inward/record.url?scp=55949092065&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=55949092065&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:55949092065

SN - 9781604234350

T3 - Materials Research Society Symposium Proceedings

SP - 337

EP - 361

BT - Materials Research Society Symposium Proceedings - Advances in In Situ Characterization of Film Growth and Interface Processes

T2 - 2006 MRS Fall Meeting - Advances in In Situ Characterization of Film Growth and Interface Processes

Y2 - 27 November 2006 through 1 December 2006

ER -

X-ray standing wave imaging of atoms at interfaces

Publication series

Other

ASJC Scopus subject areas

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Cite this