X-ray standing wave studies of AD-dimers on Si(001)

Y. Qian*, P. F. Lyman, M. J. Bedzyk, J. Zegenhagen

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

1 Scopus citations

Abstract

X-ray standing waves generated by dynamical Bragg diffraction were used as an element-specific structural probe for investigating Ga and Sb adsorption on Si(001). Using the (004) and (022) reflections, we precisely measured Ga and Sb ad-dimer bond lengths and ad-dimer heights above the bulk-extrapolated Si(001) surface. The room temperature [001] thermal vibration amplitudes of Ga and Sb adatoms on Si(001) were also directly determined by combining the fundamental (004) and high-order harmonic (008) X-ray standing wave measurements. These high-resolution measurements reveal important quantitative structural information regarding the dimerized surface structures, and provide a stringent test for structural models proposed by various theoretical calculations. In this paper, we also give an overview of the X-ray standing wave technique and its application in investigating surface structure and dynamics.

Original languageEnglish (US)
Pages (from-to)969-980
Number of pages12
JournalScanning Microscopy
Volume9
Issue number4
StatePublished - Dec 1 1995

Keywords

  • dimer orientation
  • Ga
  • Sb
  • Si(001)
  • surface structure
  • thermal vibrational amplitude
  • X-ray standing wave

ASJC Scopus subject areas

  • Instrumentation

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