X-RAY STUDY OF DOMAIN STRUCTURE AND STRESS IN Pd//2Si FILMS AT Pd-Si INTERFACES.

Haydn Chen*, G. E. White, S. R. Stock, P. S. Ho

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposia Proceedings
PublisherNorth-Holland Publ Co
Pages165-117
Number of pages49
Volume10
ISBN (Print)0444007741
StatePublished - Dec 1 1982

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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