XPS analysis on the surface of CdZnTe Annealed in Ar and H2 atmosphere

Xin Guo, Wan Qi Jie*, Yihui He, Yan Zhou, Tao Wang

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

CZT crystals were annealed in Ar and H2 atmosphere under the same temperature conditions. XPS analysis with sputter depth profiling was employed to analyze the surface composition and valence states after annealing. Based on the above results, the possible surface structure and composition of CZT crystals were determined before and after annealing. In contrast to the Ar atmosphere annealing, TeO2 and Te-rich layer had a significant reduction owing to chemical reaction with H2 during the H2 atmosphere annealing. Because of the elimination of TeO2 and Te-rich layer, the contact area between H and CZT was increased to promote further reaction of H with CZT.

Original languageEnglish (US)
Pages (from-to)2487-2491
Number of pages5
JournalRengong Jingti Xuebao/Journal of Synthetic Crystals
Volume43
Issue number10
StatePublished - Oct 1 2014

Keywords

  • Annealing
  • CdZnTe
  • XPS

ASJC Scopus subject areas

  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Fingerprint Dive into the research topics of 'XPS analysis on the surface of CdZnTe Annealed in Ar and H<sub>2</sub> atmosphere'. Together they form a unique fingerprint.

  • Cite this