XSW Imaging

Michael J Bedzyk, P. Fenter

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

The summation of XSW measured hkl Fourier components is used to generate a model-independent real-space map of an XRF-selected atomic distribution. As a demonstration, this Fourier inversion method is used to generate a set of 1D maps for a set of naturally occurring impurity ions within a mica crystal and a 3D map for adsorbed Sn atoms on a Ge(111) single crystal surface.
Original languageEnglish (US)
Title of host publicationThe X-Ray Standing Wave Technique: Principles and Applications
EditorsJorg Zegenhagen, Alexander Kazimirov
PublisherWorld Scientific Publishing Company
Pages289-302
Number of pages14
ISBN (Electronic)978-981-4513-10-4
ISBN (Print)978-981-277-900-7
StatePublished - Apr 15 2013

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