Abstract
The summation of XSW measured hkl Fourier components is used to generate a model-independent real-space map of an XRF-selected atomic distribution. As a demonstration, this Fourier inversion method is used to generate a set of 1D maps for a set of naturally occurring impurity ions within a mica crystal and a 3D map for adsorbed Sn atoms on a Ge(111) single crystal surface.
| Original language | English (US) |
|---|---|
| Title of host publication | The X-Ray Standing Wave Technique: Principles and Applications |
| Editors | Jorg Zegenhagen, Alexander Kazimirov |
| Publisher | World Scientific Publishing Company |
| Pages | 289-302 |
| Number of pages | 14 |
| ISBN (Electronic) | 978-981-4513-10-4 |
| ISBN (Print) | 978-981-277-900-7 |
| State | Published - Apr 15 2013 |