Abstract
The summation of XSW measured hkl Fourier components is used to generate a model-independent real-space map of an XRF-selected atomic distribution. As a demonstration, this Fourier inversion method is used to generate a set of 1D maps for a set of naturally occurring impurity ions within a mica crystal and a 3D map for adsorbed Sn atoms on a Ge(111) single crystal surface.
Original language | English (US) |
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Title of host publication | X-ray Standing Wave Technique, The |
Subtitle of host publication | Principles And Applications |
Publisher | World Scientific Publishing Co. |
Pages | 289-302 |
Number of pages | 14 |
ISBN (Electronic) | 9789812779014 |
DOIs | |
State | Published - Jan 1 2013 |
ASJC Scopus subject areas
- General Physics and Astronomy
- General Engineering
- General Materials Science