Xsw imaging

Michael J. Bedzyk, Paul Fenter

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Scopus citations

Abstract

The summation of XSW measured hkl Fourier components is used to generate a model-independent real-space map of an XRF-selected atomic distribution. As a demonstration, this Fourier inversion method is used to generate a set of 1D maps for a set of naturally occurring impurity ions within a mica crystal and a 3D map for adsorbed Sn atoms on a Ge(111) single crystal surface.

Original languageEnglish (US)
Title of host publicationX-ray Standing Wave Technique, The
Subtitle of host publicationPrinciples And Applications
PublisherWorld Scientific Publishing Co.
Pages289-302
Number of pages14
ISBN (Electronic)9789812779014
DOIs
StatePublished - Jan 1 2013

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Engineering(all)
  • Materials Science(all)

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