Zero-Dimensional Cs                         2                         TeI                         6                          Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity

Yadong Xu; Bo Jiao; Tze Bin Song; Constantinos C. Stoumpos; Yihui He; Ido Hadar; Wenwen Lin; Wanqi Jie; Mercouri G. Kanatzidis

doi:10.1021/acsphotonics.8b01425

Zero-Dimensional Cs ₂ TeI ₆ Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity

Yadong Xu, Bo Jiao, Tze Bin Song, Constantinos C. Stoumpos, Yihui He, Ido Hadar, Wenwen Lin, Wanqi Jie, Mercouri G. Kanatzidis^*

^*Corresponding author for this work

Chemistry

Research output: Contribution to journal › Article › peer-review

75 Scopus citations

Abstract

We demonstrate a potential candidate, the 0D "all-inorganic" perovskite material Cs ₂ TeI ₆ , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs ₂ TeI ₆ consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs ₂ TeI ₆ film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 ¹⁰ ω·cm. The resulting air- and water-stable Cs ₂ TeI ₆ device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm ^-1 . A high sensitivity for Cs ₂ TeI ₆ thick film device is realized, with the value of 192 nC·R ^-1 cm ^-2 under 40 kVp X-rays at an electrical field of 250 V·cm ^-1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs ₂ TeI ₆ perovskite films will require lower radiation doses in many medical and security check applications.

Original language	English (US)
Pages (from-to)	196-203
Number of pages	8
Journal	ACS Photonics
Volume	6
Issue number	1
DOIs	https://doi.org/10.1021/acsphotonics.8b01425
State	Published - Jan 16 2019

Funding

This work was supported by the Department of Homeland Security ARI program with grant 2014-DN-077-ARI086-01. This work made use of the (EPIC, Keck-II, and/or SPID) facility of the NUANCE Center at Northwestern University. The project was also supported by the National Natural Science Foundation of China (No. U1631116) and the National Key Research and Development Program of China (2016YFE0115200). Y.X. thanks the Top International University Visiting Program for Outstanding Young Scholars of Northwestern Polytechnical University.

Keywords

Cs TeI
electrostatic spray
hard radiation
perovskite
sensitivity
thick film

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Biotechnology
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

Access to Document

10.1021/acsphotonics.8b01425

Cite this

Xu, Y., Jiao, B., Song, T. B., Stoumpos, C. C., He, Y., Hadar, I., Lin, W., Jie, W., & Kanatzidis, M. G. (2019). Zero-Dimensional Cs ₂ TeI ₆ Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity. ACS Photonics, 6(1), 196-203. https://doi.org/10.1021/acsphotonics.8b01425

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title = "Zero-Dimensional Cs 2 TeI 6 Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity",

abstract = " We demonstrate a potential candidate, the 0D {"}all-inorganic{"} perovskite material Cs 2 TeI 6 , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs 2 TeI 6 consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs 2 TeI 6 film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 10 ω·cm. The resulting air- and water-stable Cs 2 TeI 6 device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm -1 . A high sensitivity for Cs 2 TeI 6 thick film device is realized, with the value of 192 nC·R -1 cm -2 under 40 kVp X-rays at an electrical field of 250 V·cm -1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs 2 TeI 6 perovskite films will require lower radiation doses in many medical and security check applications.",

keywords = "Cs TeI, electrostatic spray, hard radiation, perovskite, sensitivity, thick film",

author = "Yadong Xu and Bo Jiao and Song, {Tze Bin} and Stoumpos, {Constantinos C.} and Yihui He and Ido Hadar and Wenwen Lin and Wanqi Jie and Kanatzidis, {Mercouri G.}",

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Xu, Y, Jiao, B, Song, TB, Stoumpos, CC, He, Y, Hadar, I, Lin, W, Jie, W & Kanatzidis, MG 2019, 'Zero-Dimensional Cs ₂ TeI ₆ Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity', ACS Photonics, vol. 6, no. 1, pp. 196-203. https://doi.org/10.1021/acsphotonics.8b01425

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T1 - Zero-Dimensional Cs 2 TeI 6 Perovskite

T2 - Solution-Processed Thick Films with High X-ray Sensitivity

AU - Xu, Yadong

AU - Jiao, Bo

AU - Song, Tze Bin

AU - Stoumpos, Constantinos C.

AU - He, Yihui

AU - Hadar, Ido

AU - Lin, Wenwen

AU - Jie, Wanqi

AU - Kanatzidis, Mercouri G.

PY - 2019/1/16

Y1 - 2019/1/16

N2 - We demonstrate a potential candidate, the 0D "all-inorganic" perovskite material Cs 2 TeI 6 , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs 2 TeI 6 consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs 2 TeI 6 film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 10 ω·cm. The resulting air- and water-stable Cs 2 TeI 6 device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm -1 . A high sensitivity for Cs 2 TeI 6 thick film device is realized, with the value of 192 nC·R -1 cm -2 under 40 kVp X-rays at an electrical field of 250 V·cm -1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs 2 TeI 6 perovskite films will require lower radiation doses in many medical and security check applications.

AB - We demonstrate a potential candidate, the 0D "all-inorganic" perovskite material Cs 2 TeI 6 , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs 2 TeI 6 consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs 2 TeI 6 film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 10 ω·cm. The resulting air- and water-stable Cs 2 TeI 6 device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm -1 . A high sensitivity for Cs 2 TeI 6 thick film device is realized, with the value of 192 nC·R -1 cm -2 under 40 kVp X-rays at an electrical field of 250 V·cm -1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs 2 TeI 6 perovskite films will require lower radiation doses in many medical and security check applications.

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KW - perovskite

KW - sensitivity

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